Concepedia

Publication | Closed Access

Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface

DOI

13

Citations

27

References

2017

Year

Y. Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani,
Microelectronics Reliability

References

YearCitations

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