ACM Transactions on Graphics · 2016 · 58 citations · 25 references
ComputingGeoinformaticsComputer VisionMachine VisionOpticsOptical ImagingReflectance ModelingBrdf ModelingCondition Number AnalysisNear-field ScanningNear-field SensingReflectance AcquisitionReflectance ReconstructionSpatially Varying ReflectanceSurface Reflectance Estimation
We develop a method to acquire the BRDF of a homogeneous flat sample from only two images, taken by a near-field perspective camera, and lit by a directional light source. Our method uses the MERL BRDF database to determine the optimal set of lightview pairs for data-driven reflectance acquisition. We develop a mathematical framework to estimate error from a given set of measurements, including the use of multiple measurements in an image simultaneously, as needed for acquisition from near-field setups. The novel error metric is essential in the near-field case, where we show that using the condition-number alone performs poorly. We demonstrate practical near-field acquisition of BRDFs from only one or two input images. Our framework generalizes to configurations like a fixed camera setup, where we also develop a simple extension to spatially-varying BRDFs by clustering the materials.
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Computer vision and pattern recognition
Nanning Zheng, George Loizou, Xiaoyi Jiang et al. · International Journal of Computer Mathematics · 2007 · 2.5K citations
Measuring and modeling anisotropic reflection
Gregory J. Ward · 1992 · 946 citations · Full text
David Foster · Optica Acta International Journal of Optics · 1976 · 679 citations
Natural Sciences, Physics, Metrology +11
A data-driven reflectance model
Wojciech Matusik, Hanspeter Pfister, Matt Brand et al. · ACM Transactions on Graphics · 2003 · 614 citations
A data-driven reflectance model
Wojciech Matusik, Hanspeter Pfister, Matt Brand et al. · 2003 · 603 citations · Full text