Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures - Concepedia

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Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures

12

Citations

22

References

2016

Year

B. Cretu, D. Boudier, Eddy Simoen, A. Veloso, Nadine Collaert

Semiconductor Science and Technology

Abstract

International audience

References

	Year	Citations

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