Publication | Closed Access
A 2.2-ps Two-Dimensional Gated-Vernier Time-to-Digital Converter With Digital Calibration
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Citations
12
References
2016
Year
EngineeringMeasurementCalibrationVernier Time-to-digital ConverterData ConverterMixed-signal Integrated CircuitComputer EngineeringEducationDigital CalibrationDigital Circuit DesignInstrumentationVernier ArchitectureMicroelectronicsStandard Vernier TdcTime-of-flight ImagingAnalog-to-digital Converter
This brief presents a two-dimensional (2-D) Vernier time-to-digital converter (TDC) which uses two 3-stage gated ring oscillators (GROs) in the X/Y Vernier branches. The already small Vernier quantization noise (~10.6 ps) is improved by the first-order noise shaping of the GRO. Moreover, since all the delay differences between the X and Y phases can be used (rather than only the diagonal line of the one-dimensional architecture), the intrinsic large latency time of the Vernier architecture is dramatically reduced. The TDC is implemented in a 65-nm CMOS process and consumes 2.3 mA from 1.0 V. The measured total noise integrated over a bandwidth of 1.25 MHz yields an equivalent TDC resolution of 2.2 ps, whereas the average latency time (within 2 ns) is less than 1/6 of that in a standard Vernier TDC.
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