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Publication | Open Access

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

DOIFull Paper Access

37

Citations

15

References

2016

Year

James N. Hilfiker, Michael Stadermann, Jianing Sun, Tom Tiwald, Jeffrey S. Hale, Philip E. Miller, Chantel Aracne-Ruddle
Applied Surface Science

References

YearCitations

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