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Franz–Keldysh effect in n-type GaN Schottky barrier diode under high reverse bias voltage
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Citations
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References
2016
Year
Wide-bandgap SemiconductorPhotonicsElectrical EngineeringOptical MaterialsFranz–keldysh EffectEngineeringSemiconductor TechnologyDepletion RegionOptical PropertiesSub-bandgap Optical AbsorptionApplied PhysicsGan Power DeviceInternal PhotoemissionCategoryiii-v SemiconductorOptoelectronicsCompound Semiconductor
Abstract The photocurrent of GaN vertical Schottky barrier diodes was investigated under sub-bandgap wavelength light irradiation. Under a low reverse bias voltage, the photocurrent is induced by internal photoemission, while under a high reverse bias voltage, the photocurrent increases significantly with the bias voltage. This is due to sub-bandgap optical absorption in a depletion region due to the Franz–Keldysh effect. The voltage and wavelength dependences of the photocurrent are successfully explained quantitatively.
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