Advanced Ceramic Materials · 1988 · 32 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsCeramicsSurface ScienceCeramic Surface TreatmentOxidation AnalysisOxidation ControlOxidation ReactionsSurface OxidationX-ray Photoelectron SpectroscopyCeramic Surface OxidationIsoelectric PointOxidationOxidation TreatmentSilicon CarbideSurface Oxidation EffectsSurface Oxidation MechanismsWhisker-reinforced Ceramics
The extent of surface oxidation controls the stability of silicon carbide aqueous suspensions. In the present study, x-ray photon spectroscopy (XPS) was used to determine the extent of oxygen on as-received and oxidized silicon carbide whiskers. The isoelectric points at pH 6.0 and pH 4.0 for the as-received and oxidized whiskers, respectively, correlated with the XPS analyses, indicating essentially a silica surface on the oxidized whiskers and both Si-O and Si-C bonds on the surface of the as-received whiskers. Suggestions are made regarding the utility of the oxidation treatment in processing whisker-reinforced ceramics.
10
Elements of X-Ray Diffraction.
N. W. Gregory · Journal of the American Chemical Society · 1957 · 1.7K citations