IEEE Journal of Solid-State Circuits · 2016 · 79 citations · 19 references
EngineeringComputer EngineeringElectrical EngineeringAnalog ElectronicsLow-power DesignMicroelectronicsAnalog Integrated CircuitsClock ManagementCmos Circuit DesignLow-power Digital Circuit DesignMixed-signal Integrated Circuit DesignNoise In Analog CircuitsAnalog-digital ConversionAnalog-to-digital ConversionAnalog-to-digital Converter DesignAnalog-to-digital ConvertersCmos Analog Integrated CircuitsCmos ScalingComparator DesignPower Consumption
This paper presents an asynchronous SAR-assisted time-interleaved SAR (SATI-SAR) ADC as a suitable architecture in a low-supply-voltage condition. Settling-While-Conversion enabled by the Assist-ADC relaxes the DAC settling time requirement and makes it possible to insert a minimized capacitor shuffling logic with no speed penalty. A proposed gain-boosting dynamic pre-amplifier enhances the noise performance of the comparator and a self time-reference generation function is embedded in the pre-amplifier for a speed-enhanced asynchronous decision. A proposed dual-mode clock generator generates a low-jitter fixed-width sampling pulse for high-frequency operation while it generates a low-power-but-low-quality clock for low-frequency operation. With the dual-mode clock generator enabled, a prototype 65 nm CMOS 0.6 V 12 b 10 MS/s ADC achieves an ENOB of 10.4 at a Nyquist-rate input, and the peaks of DNL and INL are measured to be 0.24 LSB and 0.45 LSB, respectively. The FoM is 6.2 fJ/conversion-step with a power consumption of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$83~\mu \text {W}$ </tex-math></inline-formula> . The ADC operates under the lowest supply voltage of 0.6 V among comparable designs with ENOBs over 10 and conversion rates over 1 MS/s.
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A low-noise self-calibrating dynamic comparator for high-speed ADCs
Masaya Miyahara, Yusuke Asada, Daehwa Paik et al. · 2008 · 414 citations
Engineering, Computer Engineering, Electrical Engineering +17
11.2 A 0.85fJ/conversion-step 10b 200kS/s subranging SAR ADC in 40nm CMOS
Hung-Yen Tai, Yao-Sheng Hu, Hung‐Wei Chen et al. · 2014 · 222 citations
Engineering, Computer Engineering, Electrical Engineering +17