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EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsRadiation Damage In MaterialsSemiconductor Crystal GrowthSemiconductor Device MaterialsSilicon MaterialsElectrical PropertiesSiliconSilicon CharacterizationSilicon Electrical PropertiesSilicon Physics
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Low-Frequency Conductivity Due to Hopping Processes in Silicon
M. Pollak, T. H. Geballe · Physical Review · 1961 · 1.3K citations
Scientific Charge-Coupled Devices
James R. Janesick, Tom Elliott, S. A. Collins et al. · Optical Engineering · 1987 · 862 citations
Engineering, Physics, Photonics +16