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Analysis of Single-event Upset for SRAM Devices by Using the MC-50 Cyclotron

Jong Kang Park, Soon-Gyu Kwon, Seung Wook Lee, Jong Tae Kim, Jong‐Seo Chai, Jae Won Shin, Seung‐Woo Hong

Journal of the Korean Physical Society · 2011 · 11 citations · 0 references

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