Physical Review B · 2014 · 51 citations · 36 references
Natural SciencesMaterials SciencePhysicsMaterials CharacterizationMaterials PhysicsNanomaterialsEpitaxial GrowthGraphene NanomaterialsThin-film MaterialsEpitaxial MaterialsGrapheneLattice Parameter AnalysisLattice Parameter DeterminationLattice Parameter MeasurementSilicon Carbide (Sic) MaterialsSynchrotron DiffractionSynchrotron X-ray Diffraction
The authors employ synchrotron-based grazing incidence diffraction to measure the in-plane lattice parameter of single atomic layers in different high-quality epitaxial graphene/SiC(0001) samples. Their results provide useful information on the role of a buffer layer in graphene growth on SiC.
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Raman Spectrum of Graphene and Graphene Layers
Andrea C. Ferrari, Jannik C. Meyer, Vittorio Scardaci et al. · Physical Review Letters · 2006 · 14.9K citations · Full text
Kostya S. Novoselov, Vladimir I. Fal’ko, Luigi Colombo et al. · Nature · 2012 · 9.2K citations
Natural Sciences, Materials Engineering, Materials Science +9