Concepedia

Direct investigation of (sub-) surface preparation artifacts in GaAs based materials by FIB sectioning

Jürgen Belz, Andreas Beyer, Torsten Torunski, W. Stolz, Kerstin Volz

Ultramicroscopy · 2016 · 15 citations · 53 references

DOI

Concepts

References

53

Channeling and related effects in the motion of charged particles through crystals

D. S. Gemmell · Reviews of Modern Physics · 1974 · 1.5K citations

, , +12

High-resolution Z-contrast imaging of crystals

Stephen J. Pennycook, D. E. Jesson · Ultramicroscopy · 1991 · 939 citations

, , +11

1-eV solar cells with GaInNAs active layer

Daniel J. Friedman, John F. Geisz, Sarah Kurtz et al. · Journal of Crystal Growth · 1998 · 418 citations

, , +14

Review of Atom Probe FIB-Based Specimen Preparation Methods

Michael K. Miller, K.F. Russell, Keith Thompson et al. · Microscopy and Microanalysis · 2007 · 397 citations

, , +7

Sample preparation for atomic-resolution STEM at low voltages by FIB

Miroslava Schaffer, Bernhard Schaffer, Quentin M. Ramasse · Ultramicroscopy · 2012 · 395 citations

, , +5