Static Magnetic Proximity Effect in Pt Layers on Sputter-Deposited NiFe<sub>2</sub>O<sub>4</sub>and on Fe of Various Thicknesses Investigated by XRMR

Timo Kuschel, Christoph Klewe, Panagiota Bougiatioti, Olga Kuschel, J. Wollschläger, L. Bouchenoire, S. D. Brown, J. Schmalhorst, Daniel Meier, Günter Reiss

IEEE Transactions on Magnetics · 2016 · 22 citations · 24 references

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Abstract

The longitudinal spin Seebeck effect is detected in sputter-deposited NiFe <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> films using Pt as a spin detector and compared with the previously investigated NiFe <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> films prepared by chemical vapor deposition. Anomalous Nernst effects induced by the magnetic proximity effect (MPE) in Pt can be excluded for the sputter-deposited NiFe <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> films down to a certain limit, since X-ray resonant magnetic reflectivity measurements show no magnetic response down to a limit of 0.04 μB per Pt atom comparable with the case of the chemically deposited NiFe <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> films. These differently prepared films have various thicknesses. Therefore, we further studied Pt/Fe reference samples with various Fe thicknesses and could confirm that the MPE is only induced by the interface properties of the magnetic material.

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