Journal of Physics D Applied Physics · 1968 · 69 citations · 8 references
Natural SciencesPhysicsInstrumentationMetrologyOpticsInterferometryOptical MetrologyX-ray DiffractionX-ray OpticsBacklashBacklash ReductionElastic DesignInterferometer DesignInterferometric Length MeasurementOptical InterferometersX-ray InterferometryX-ray Reflectivity
As a first step in the establishment of an absolute scale of length in the region of 10−10 m an x-ray interferometer has been used to measure distances. In preliminary experiments several hundred high-contrast x-ray moiré fringes have been recorded, enabling distances from 0 to 0·1 μm to be measured with a precision of ±0·02 Å. Two novel features, x-ray interferometers working in the low absorption Laue-case (transmission geometry) and the extensive application of spring-strip elastic design, combine to give high intensity with almost perfect stability and backlash-free operation.
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U. Bonse, Michael Hart · Applied Physics Letters · 1965 · 1K citations
Parallel and rectilinear spring movements
R V Jones · Journal of Scientific Instruments · 1951 · 72 citations