Semiconductor Science and Technology · 2015 · 17 citations · 12 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationMos CapacitorsSemiconductor HeterostructuresSemiconductor InterfacesWide Band Gap SemiconductorsWide-bandgap SemiconductorsChargesGallium Nitride (Gan) MaterialsGallium Nitride Power DevicesGate Oxide DegradationHeterostructure DevicesNitride PassivationPlasma TreatmentThreshold Voltage
GaN MOSFETs on a AlGaN/GaN heterostructure with a recess gate were fabricated. The charges near the SiO2/GaN interface of the GaN MOSFETs with different etching conditions were evaluated. It was found that stronger bombardment damage in the dry process will bring more charges near the interface and finally make the threshold voltage of the device negative. Nitrogen plasma treatment and ammonia water (NH4OH) treatment were investigated to recover or remove the damaged layer in order to achieve an enhancement-mode (E-mode) device with positive threshold voltage on the dry-recessed semi-insulating (SI) GaN surface. The influence of these treatments on the interface state density was also characterized using the Terman method by using the GaN MOS capacitor. An E-mode GaN MOSFET with a maximum field-effect mobility of 148.1 cm2 V−1 s−1 and a MOS capacitor with an interface state density of 3 × 1011 cm−2 eV−1 were realized by the NH4OH treatment.
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Copper gate AlGaN/GaN HEMT with low gate leakage current
Jin‐Ping Ao, Daigo Kikuta, Naotaka Kubota et al. · IEEE Electron Device Letters · 2003 · 74 citations