Voight Function Model in Diffraction-Line Broadening Analysis

Abstract

Diffraction-line broadening routes are briefly reviewed. Both laboratory and synchrotron xray measurements of W and MgO showed that a Voigt function satisfactorily fits the physicall y broadened line profiles. The consequences of an assumed Voigt-function profile shape for both sizebroadened and strain-broadened profiles (“double-Voigt” method) are studied. It is shown that th e relationship between parameters obtained by the Warren-Averbach approximation and integralbreadth methods becomes possible. Line-broadening analysis of W and MgO is performed by using the Warren-Averbach and double-Voigt approaches and results are compared.