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Development of Quantum Hall Array Resistance Standards at NMIJ
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References
2011
Year
SemiconductorsQuantum ScienceElectrical EngineeringQhars DeviceEngineeringQuantum ComputingPhysicsQuantum TechnologyQuantum DeviceApplied PhysicsQuantum MaterialsCondensed Matter PhysicsNominal ValueQuantum DevicesHall Bar Elements
A quantum Hall array resistance standard (QHARS) device with a nominal value close to 10 kΩ on the <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">i</i> = 2 plateau has been developed on a GaAs/AlGaAs heterosubstrate. This QHARS device consists of 266 Hall bar elements, and its nominal value has only 0.0342 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-6</sup> difference based on <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">K-90</sub> ( = 25 812.807 Ω) from an integer value of 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sup> . As a result of comparison measurements with the conventional Quantized Hall Resistance Standard via the 100- Ω standard resistor, the value of the QHARS device agrees with its nominal value within 3.5 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-8</sup> .
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Precision tests of quantum hall effect device DC equivalent circuit using double-series and triple-series connections A. Jeffery, Randolph E. Elmquist, M.E. Cage Journal of Research of the National Institute of Standards and Technology Categoryquantum ElectronicsQuantum ScienceElectrical EngineeringSpintronicsEngineering | 1995 | 34 |
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