Performance-Aware Corner Model for Design for Manufacturing

Abstract

<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> We present a methodology to generate performance-aware corner models (PAMs). Accuracy is improved by emphasizing electrical variation data and reconciling the process and electrical variation data. PAM supports corner (<formula formulatype="inline"><tex Notation="TeX">$\pm \sigma$</tex></formula> and <formula formulatype="inline"><tex Notation="TeX">$\pm \hbox{2}\sigma$</tex></formula>) simulation and Monte Carlo simulation. Furthermore, PAM supports the practice of application-specific corner cards, for example, for gain-sensitive applications. </para>