Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists

Abstract

Article Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists Share on Authors: Srikanth Venkataraman Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL Center for Reliable and High-Performance Computing, University of Illinois, Urbana, ILView Profile , Ismed Hartanto Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL Center for Reliable and High-Performance Computing, University of Illinois, Urbana, ILView Profile , W. Kent Fuchs Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL Center for Reliable and High-Performance Computing, University of Illinois, Urbana, ILView Profile , Elizabeth M. Rudnick Motorola Inc., Austin, TX Motorola Inc., Austin, TXView Profile , Sreejit Chakravarty State University of New York, Buffalo, NY State University of New York, Buffalo, NYView Profile , Janak H. Patel Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL Center for Reliable and High-Performance Computing, University of Illinois, Urbana, ILSearch about this author Authors Info & Claims DAC '95: Proceedings of the 32nd annual ACM/IEEE Design Automation ConferenceJanuary 1995 Pages 133–138https://doi.org/10.1145/217474.217519Online:01 January 1995Publication History 30citation206DownloadsMetricsTotal Citations30Total Downloads206Last 12 Months4Last 6 weeks0 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteGet Access