A high accuracy triangle-wave signal generator for on-chip ADC testing

Abstract

A general BIST architecture for A-to-D converters involves the integration of both an analog test signal generator and a digital output response analyzer. This paper presents a structure for the internal generation of a linear signal used with the histogram-based test technique. The structure is based on two highly linear ramp generators together with a feedback control circuitry. Results show that the proposed structure preserves the linearity of the ramp generators while accuracy of the triangle-wave is provided by means of a calibration scheme.