Test synthesis in the behavioral domain

TLDR

The paper proposes a method for test synthesis in the behavioral domain. The approach adds test behavior to the design, merges it with normal‑mode behavior, derives test behavior using testability metrics, and synthesizes a testable circuit with embedded BIST structures and a behavioral test scheme that integrates the test controller into the system controller. Results show that inserting testability before synthesis yields a physical implementation that is easier to test than one synthesized directly from the original behavior.

Abstract

A method for test synthesis in the behavioral domain is described. The approach is based on the addition of test behavior, which is the behavior of the design in test mode. The normal-mode design behavior and test-mode test behavior are combined and synthesized together to produce a testable design with inserted BIST structures. Derivation of an appropriate test behavior uses analysis based on metrics that quantify the testability of signals embedded within behaviors. The synthesized circuit is tested using a behavioral test scheme which allows the test controller to be easily embedded within the system controller, and the entire datapath and controller to be easily tested together. Results show that when the testability insertion procedure is used to modify a behavior before synthesis, the resulting synthesized physical implementation is indeed more easily tested than an implementation synthesized directly from the original behavior.