Journal of the Optical Society of America A · 1984 · 413 citations · 14 references
WaveguidesOptical MaterialsEngineeringWave OpticMultilayer Optical WaveguidesElectromagnetic MetamaterialsOptical PropertiesGuided-wave OpticPlanar Waveguide SensorNanophotonicsPhotonicsPhysicsPlanar Multilayer WaveguidesPrism-loaded WaveguidesDepth-graded Multilayer CoatingMultilayer GuidesApplied PhysicsThin FilmsStandard 2
A standard 2 × 2 matrix method used in thin‑film optics is applied to planar multilayer optical waveguides. A first‑order perturbation theory is developed and applied to absorbing multilayer guides and to the reflection of plane waves from a prism‑loaded lossy multilayer guide. The authors derive field‑transfer equations for bound and leaky modes, compute field profiles and power distributions, develop a perturbation theory for absorbing multilayer guides, and propose experimental setups to measure losses via gap thickness and propagation constant.
A standard 2 × 2 matrix method-used in thin-film optics is applied to planar multilayer optical waveguides. All modes are required to satisfy substrate-to-cover field-transfer equations that reduce to the equation γcm11 + γcγsm12 + m21 + γsm22 = 0 for bound modes and leaky waves. Expressions are derived for the field profiles and the power in each medium. A first-order perturbation theory is developed and applied to absorbing multilayer guides and to the reflection of plane waves from the prism-loaded lossy multilayer guide. The latter leads to experimental arrangements for measuring losses in which the gap thickness and propagation constant are accessible parameters.
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