IEEE Embedded Systems Letters · 2010 · 31 citations · 4 references
EngineeringSpace EnvironmentMem TestingComputer ArchitectureFault ClassificationHardware SecurityReliability EngineeringFault AnalysisSystems EngineeringHardware ReliabilityField-programmable Gate ArraysComputer EngineeringPermanent FaultsComputer ScienceRadiation EffectsFpga DesignMemory ArchitectureSram-based FpgasProgram AnalysisFault AttackFault Injection
This letter proposes a classification algorithm to discriminate between recoverable and not recoverable faults occurring in static random access memory (SRAM)-based field-programmable gate arrays (FPGAs), with the final aim of devising a methodology to enable the exploitation of these devices also in space applications, typically characterized by long mission times, where permanent faults become an issue. By starting from a characterization of the radiation effects and aging mechanisms, we define a controller able to classify such faults and consequently to apply the appropriate mitigation strategy.
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SEU-induced persistent error propagation in FPGAs
Keith Morgan, Michael Caffrey, Paul Graham et al. · IEEE Transactions on Nuclear Science · 2005 · 106 citations
Hardware Security, Cross Section, Reliability Engineering +14