Japanese Journal of Applied Physics · 2002 · 15 citations · 4 references
EngineeringAerospace EngineeringAstronomyRadiation MeasurementRadiation PhysicsX-ray AstronomyRadiation HardeningX-ray DetectionX-ray DetectorsCharge Transfer EfficiencyRadiation DamageRadiation Damage EffectsRadiation Damage Effects On DetectorsRadiation Damage In DetectorsRadiation Damage In X-ray DetectorsRadiation ToleranceX-ray Irradiation
We have investigated the radiation damage effects on a CCD to be employed in the Japanese X-ray astronomy mission including the Monitor of All-sky X-ray Image (MAXI) onboard the International Space Station (ISS). Since low energy protons release their energy mainly at the charge transfer channel, resulting a decrease of the charge transfer efficiency, we thus focused on the low energy protons in our experiments. A 171keV to 3.91MeV proton beam was irradiated to a given device. We measured the degradation of the charge transfer inefficiency (CTI) as a function of incremental fluence. A 292keV proton beam degraded the CTI most seriously. Taking into account the proton energy dependence of the CTI, we confirmed that the transfer channel has the lowest radiation tolerance. We have also developed the different device architectures to reduce the radiation damage in orbit. Among them, the “notch ” CCD, in which the buried channel implant concentration is increased, resulting in a deeper potential well than outside, has three times higher radiation tolerance than that of the normal CCD. We then estimated the charge transfer inefficiency of the CCD in the orbit of ISS, considering the protonenergy spectrum. The CTI value is estimated to be 1.1 ×10−5 per each transfer after two years of mission life in the worse case analysis if the highest radiation-tolerant device is
4
Physics of Semiconductor Devices
Geoffrey Pridham · Electronics and Power · 1970 · 4K citations
Radiation effects in oxynitrides grown in N/sub 2/O
N. S. Saks, M. Simons, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 1994 · 22 citations · Full text