Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM) - Concepedia

Concepedia

Publication | Open Access

Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)

DOI Full Paper Access

27

Citations

15

References

2011

Year

Gustavo A. Schwartz, Clément Riedel, Richard Arinero, Ph. Tordjeman, Ángel Alegría, Juan Colmenero

Ultramicroscopy

Materials ScienceEngineeringNanomaterialsNanotechnologyMicroscopyMicroscopy MethodApplied PhysicsNano Electro Mechanical SystemScanning Force MicroscopyBroadband Nanodielectric SpectroscopyScanning Probe MicroscopyNanometrology

References

	Year	Citations

Page 1

Page 1