IEEE Transactions on Circuits & Systems II Express Briefs · 2008 · 33 citations · 12 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesVlsi DesignCmos Circuit DesignDynamic Power ReductionIntegrated Circuit DesignMixed-signal Integrated Circuit DesignTransistor BiasingVoltage ScalingLow-power Amplifier DesignLow-voltage Cmos DesignMemory Circuit DesignTransistor Sizing For Subthreshold OperationUltra-low-voltage Circuit Design
A novel high-speed sense amplifier for ultra-low-voltage SRAM applications is presented. It introduces a completely different way of sizing the aspect ratio of the transistors on the data-path, hence realizing a current-voltage hybrid mode Sense Amplifier. Extensive post-layout simulations have proved that the new Sense Amplifier provides both high-speed and low-power properties, with its delay and power reduced to 25.8% and 37.6% of those of the best prior art. It also offers a much better read-effectiveness and robustness against the bit- and data-line capacitances as well as V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">DD</sub> variations. Furthermore, the new Sense Amplifier is able to tolerate a large difference between the parasitic capacitances associated with the complementary DLs. It can operate down to a supply voltage of 0.9 V, the lowest reported for a 0.18 mum CMOS process. A modified cross-coupled amplifier is also introduced, allowing the Sense Amplifier to operate down to 0.55 V.
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