Local Spectral Responses of Transition Metal Dichalcogenides in Photoelectrochemical Cells

Abstract

Scanning light‐spot techniques can be advantageously employed to gain microscopic information on the photoelectrochemical behavior of surface defects and on the spatial distribution of diffusion length. Such techniques have been used in systems based on and layer‐type, semiconductor anodes to measure both photocurrent profiles at fixed wavelengths and photocurrent spectral responses at fixed points on the photoelectrode surface.