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Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions
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2000
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Materials ScienceMaterials EngineeringElectrical EngineeringAluminium NitrideEngineeringNanoelectronicsApplied PhysicsAl/ti-based Ohmic ContactsSemiconductor MaterialStructural CeramicP-type 4H-sic AnnealedVarious ConditionsCarbide
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