Physics-Uspekhi · 2015 · 13 citations · 40 references
Natural SciencesMaterials EngineeringMaterials ScienceBiomedical ImagingOpticsDefect CharacterizationDefectsDiffractionSurface MicroscopyX-ray DiffractionX-ray OpticsDefect AnalysisDiffraction ImagingSurface Defect Imaging
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Electron microscopy of thin crystals
M.E. Haine · Vacuum · 1966 · 2.4K citations
U. Bonse, Michael Hart · Applied Physics Letters · 1965 · 1K citations