Accelerated Life Testing and Reliability of High K Multilayer Ceramic Capacitors

TLDR

Accelerated life testing evaluated the reliability of high‑K multilayer ceramic capacitors, characterizing insulation‑resistance degradation as a function of voltage (2–8× rated) and temperature (85–170 °C). Failure times under voltage‑temperature stress conformed to a log‑normal distribution with a standard deviation typically less than 0.5, and a small infant‑mortality population was observed in some samples.

Abstract

The reliability of high K muitilayer ceramic capacitors was evaluated using accelerated life testing. The degradation in insulation resistance was characterized as a function of voltage (two to eight times rated) and temperature (85 to 170°C). The times to failure at a voltage-temperature stress conformed to a iognormai distribution with a standard deviation typically less than 0.5. A small infant mortality population was also observed for some samples. The results were least-squares fit to the following equation: