Publication | Closed Access
Mismatch-Aware Common-Centroid Placement for Arbitrary-Ratio Capacitor Arrays Considering Dummy Capacitors
38
Citations
21
References
2012
Year
Electrical EngineeringPhysical Design (Electronics)EngineeringVlsi DesignCircuit DesignSwitched CapacitorsCommon-centroid StructureMixed-signal Integrated CircuitAnalog DesignComputer EngineeringComputer ArchitecturePlacement ShapeMicroelectronicsMismatch-aware Common-centroid Placement
Switched capacitors are commonly used in analog circuits to increase the accuracy of analog signal processing and lower power consumption. To take full advantage of switched capacitors, it is very important to achieve accurate capacitance ratios in the layout of the capacitor arrays, which are affected by systematic and random mismatches. A good capacitor placement should have a common-centroid structure with the highest possible degree of dispersion to mitigate mismatches. Several dummy units should be inserted to make the placement shape more square and compact. This paper proposes a simulated-annealing-based approach for mismatch-aware common-centroid placement under the above constraints. A pair-sequence representation is used to record a placement, and a couple of associated operations are developed to find better solutions. The experimental results show that the proposed placements achieve smaller oxide-gradient-induced mismatch and larger overall correlation coefficients (i.e., higher degree of dispersion) than those of previous works.
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