Publication | Open Access
A Comparison of Xenon Plasma FIB Technology with Conventional Gallium LMIS FIB: Imaging, Milling, and Gas-Assisted Applications
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2011
Year
Materials EngineeringMaterials ScienceEngineeringPhysicsMicroscopyMaterials FabricationMicroscopy MethodApplied PhysicsAugust 7–AugustGas-assisted ApplicationsMicroanalysisMicroanalysis 2011X-ray Free-electron LaserMedicineBiophysicsX-ray Fluorescence
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.