IEEE Transactions on Electron Devices · 2011 · 221 citations · 11 references
EngineeringElectrical EngineeringPhysicsElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportCharge Carrier TransportDevice ModelingElectron TransportSemiconductor PhysicsWide Band Gap SemiconductorsCarrier Mobility ModelingCarrier Transport ModelingCharge Carrier DensityCharge Transport ModelingElectron DensityHigh-electron-mobility Transistor ModelingHigh-electron-mobility TransistorsSemiconductor Device Modeling
In this brief, we present a physics-based analytical model for 2-D electron gas density <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ns</i> in AlGaN/GaN high-electron mobility transistors. The proposed model accounts for the interdependence between Fermi level <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Ef</i> and <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ns</i> . The model is developed by considering the variation of <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Ef</i> , the first subband <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">E</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> , the second subband <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">E</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> , and <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ns</i> with applied gate voltage <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Vg</i> . The proposed model is in very good agreement with numerical calculations.
11
GaN-Based RF Power Devices and Amplifiers
Umesh K. Mishra, Likun Shen, T.E. Kazior et al. · Proceedings of the IEEE · 2008 · 1.8K citations