Dispatching Rules For Semiconductor Testing Operations: A Computational Study

Abstract

In this paper we compare the performance of different dispatching rules in a semiconductor testing environment for a variety of due-date and cycle time related performance measures. We also examine the effect of different models of job arrivals and uncertainties in the problem data on the performance of the dispatching rules. Our results indicate that no one rule performs well for all performance measures, and that performanceis robust to uncertainties and non-homogeneity in the arrival process.