Concepedia

7-μm-cutoff PtSi infrared detector for high sensitivity MWIR applications

T. L. Lin, J.S. Park, Sarath D. Gunapala, Eric W. Jones, Hector M. Del Castillo, M. M. Weeks, P.W. Pellegrini

IEEE Electron Device Letters · 1995 · 20 citations · 4 references

Abstract

PtSi Schottky infrared detectors with extended cutoff wavelengths of 5.7, 6.6, and 7.3 μm have been demonstrated by incorporating a thin p+ layer at the PtSi-Si interface for high sensitivity medium wavelength infrared imaging applications. The response uniformity of the 7-μm cutoff detector was studied.

References

4

Long-wavelength PtSi infrared detectors fabricated by incorporating a <i>p</i>+ doping spike grown by molecular beam epitaxy

T. L. Lin, J. S. Park, T. George et al. · Applied Physics Letters · 1993 · 31 citations

Engineering, Materials Engineering, Materials Science +17

Infrared internal emission detectors

Freeman D. Shepherd · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1992 · 26 citations

Engineering, Electrical Engineering, Materials Science +17

<title>High-performance 1040- x 1040-element PtSi Schottky-barrier image sensor</title>

Masafumi Kimata, Naoki Yutani, Natsuro Tsubouchi et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1993 · 14 citations

Engineering, Electrical Engineering, Materials Science +17

Excess low-frequency noise in PtSi on p-type Si Schottky diodes

J. Mooney · IEEE Transactions on Electron Devices · 1991 · 13 citations · Full text

Engineering, Electrical Engineering, Analog Electronics +10

7-μm-cutoff PtSi infrared detector for high sensitivity MWIR applications

Concepts

Abstract

References