IEEE Transactions on Nuclear Science · 2002 · 167 citations · 10 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingMicroelectronicsSemiconductor DevicesDevice ReliabilityDevice ScalingHardware Fault ToleranceMicroarchitecture DesignProcessor Core DesignProcessor MicroarchitectureCharge CollectionDevice Scaling EffectsError Correction CodesFlip-chip PackagingProcess ScalingSoft Error MitigationSoft ErrorsTechnology Scaling
The impact of technology scaling and logic design on the /spl alpha/-particle and neutron-induced soft-error rate (SER) of Alpha microprocessors (HP Alpha Development Group, Shrewsbury, MA) has been investigated. Our results indicate that the reduced charge-collection efficiency at the device level as well as circuit- and system-level mitigation techniques have successfully combatted the scaling trend of the critical charge. Process scaling and the introduction of flip-chip packaging have resulted in a nonnegligible contribution of /spl alpha/-particle-induced failure rates to the core-logic SER, whose overall importance has increased considerably since the implementation of error-correction codes.
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