Publication | Open Access
A new junction termination technique: The Deep Trench Termination (DT<sup>2</sup>)
29
Citations
9
References
2009
Year
Electrical EngineeringEngineeringHigh Voltage EngineeringPlane JunctionPower DeviceNew ConceptTime-dependent Dielectric BreakdownComputer EngineeringDeep Trench TerminationPower Semiconductor DeviceElectrical InsulationPower ElectronicsMicroelectronicsPower Electronic Devices
Numerous techniques have been used to improve the voltage handling capability of high voltage power devices with the aim to obtain the breakdown of a plane junction. In this work, a new concept of low cost, low surface and high efficiency junction termination for power devices is presented and experimentally validated. This termination is based on a large and deep trench filled by BCB (BenzoCycloButene) associated to a field plate. Simulation results show the important impact of trench design and field plate width on termination performances. The experimental breakdown voltage of this Deep Trench Termination (DT <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> ) is close to 1300 Volts: this value validates not only the concept of the DT <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> but also the choice of the BCB as a good dielectric material for this termination.
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