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Complementary Si MESFET concept using silicon-on-sapphire technology
19
Citations
4
References
1988
Year
Semiconductor TechnologyElectrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsElectronic EngineeringApplied PhysicsSemiconductor Device FabricationIntegrated CircuitsComplementary Si MesfetPower SemiconductorsSilicon On InsulatorMicroelectronicsComplementary Si MesfetsCmes InvertersHigh Barrier Heights
Complementary Si MESFETs (CMES) for integrated circuits using silicon-on-sapphire are described. Not only the gate, but also the source and drain of the n-transistors and p-transistors are Schottky junctions, using very high barrier heights for the gate and low barrier heights for source and drain. Only two Schottky metals are used: one, Ir or Pt, giving a high barrier on nSi, and hence low on pSi; the other, Er or Tb, showing the opposite behavior. The basic differences between MES and MOS are pointed out and design criteria for CMES inverters using normally-off type transistors are given.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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