IEEE Transactions on Instrumentation and Measurement · 1997 · 78 citations · 9 references
EngineeringElectrical EngineeringPhysicsMicroelectronicsSemiconductor DevicesSolid State PhysicsDevice CharacterizationElectrical ConductivityHall Conductance QuantizationHall ConductivityHall Effect MeasurementsResistivity MeasurementSystematic Errors
The latest NIST result from the comparison of the quantized Hall resistance (QHR) with the realization of the SI ohm obtained from the NIST calculable capacitor is reported. A small difference between the 1988 result and the present result has led to a re-evaluation of the sources and magnitudes of possible systematic errors.
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M.E. Cage, R.F. Dziuba, Randolph E. Elmquist et al. · IEEE Transactions on Instrumentation and Measurement · 1989 · 87 citations · Full text