Publication | Closed Access
Low-temperature polycrystalline-silicon TFT on 7059 glass
12
Citations
4
References
1989
Year
Thin-film TransistorEngineeringGlass MaterialThin Film Process TechnologyPlasma ProcessingGlass-ceramicGlass TransitionPoly-si DeviceThin Film ProcessingThin-film TechnologyMaterials ScienceMaterials EngineeringElectrical EngineeringLow-temperature Polycrystalline-silicon TftThin Film MaterialsSemiconductor Device FabricationElectronic MaterialsMicrofabricationApplied PhysicsDrain ContactsThin Film DevicesThin Films
A polycrystalline-silicon (poly-Si) thin-film transistor (TFT) deposited at low temperature on Corning 7059 glass is reported. It has practical applications for low-cost thin-film display and imaging electronics manufacturing. All the process steps used to fabricate the poly-Si device take place at temperatures of 550 degrees C or less. The poly-Si films exhibit crystallite grain sizes on the order of 5000 AA, and the fabricated devices show field-effect mobilities of 10-20 cm/sup 2//V-s and threshold voltages around zero. A plasma process to form the source and drain contacts has also been developed.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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