Experimental observation of the splitting and shifting of HOLZ lines induced by a line defect in the quasicrystalline icosahedral phase of Al₇₆Si₄Mn₂₀

Abstract

Diffraction contrast images of a line defect, and splitting and shifting of the higher-order Laue-zone lines induced by the strain field of the line defect, have been observed in the Al76Si4Mn20 quasicrystalline icosahedral phase. This phenomenon suggests that convergent-beam electron diffraction can be used to study such defects not only in crystals but also in quasicrystals.