CRÈME-MC: A physics-based single event effects tool

Abstract

The CRÈME suite of tools have been extensively used to predict the effects of cosmic rays on microelectronics in space. These tools only consider electronic stopping of ions and nuclear reactions from protons on silicon. Ion-ion physics and the inclusion of additional electronic materials are required to predict large energy deposition events. The successor to the rate prediction tools, CRÈME-MC, is a Geant4 based application intended to address the challenges associated with highly-scaled or radiation-hardened devices.