From atoms to integrated circuit chips, blood cells, and bacteria with the atomic force microscope

S. A. C. Gould, B. Drake, Craig Prater, A. L. Weisenhorn, S. Manne, H. G. Hansma, Paul K. Hansma, J. Massié, M. Longmire, V. B. Elings,

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1990 · 169 citations · 0 references

Concepts

Abstract

The atomic force microscope (AFM) can now bridge the gap from imaging objects that can be seen with an optical microscope to imaging atoms: a range in magnification of 104. High magnification images of germanium show single atoms separated by 0.4 nm while low magnification images of entire cells and portions of an integrated circuit chip provide lateral and vertical information over a range of 25 μm.