Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1990 · 169 citations · 0 references
Natural SciencesBioengineeringPhysicsAtomic PhysicsNanotechnologyOpticsAtomic Force MicroscopyAtomic StructureScanning Probe MicroscopySingle-molecule ImagingSurface MicroscopyAtomic Force Microscopy AnalysisAtomic Force Microscopy Image ResolutionAtomic Force Microscopy Surface AnalysisAtomic-resolution ImagingHigh Magnification ImagingMagnificationTip-sample Interactions
The atomic force microscope (AFM) can now bridge the gap from imaging objects that can be seen with an optical microscope to imaging atoms: a range in magnification of 104. High magnification images of germanium show single atoms separated by 0.4 nm while low magnification images of entire cells and portions of an integrated circuit chip provide lateral and vertical information over a range of 25 μm.