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Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices

DOI

25

Citations

3

References

1992

Year

R. Hartley, M. A. Folkard, D. M. Carr, P. J. Orders, D. Rees, Imre Varga, V. Nirmal Kumar, Guozhen Shen, Timothy A. Steele, H. Buskes,
Journal of Crystal Growth

References

YearCitations

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