P. J. Orders

Determination of critical layer thickness in In<i>x</i>Ga1−<i>x</i>As/GaAs heterostructures by x-ray diffraction

P. J. Orders, B. F. Usher · Applied Physics Letters · 1987 · 198 citations

Materials Science, Semiconductors, Oxide Heterostructures +15

Single-scattering cluster calculations and Fourier-transform analyses of normal photoelectron diffraction

P. J. Orders, C. S. Fadley · Physical review. B, Condensed matter · 1983 · 66 citations

Engineering, Nuclear Physics, Electron Diffraction +16

Angle-resolved X-ray photoemission from core levels of c(2 × 2) CO on Ni(001): Single-scattering theory and effects of vibration

P. J. Orders, S. Kono, C. S. Fadley et al. · Surface Science · 1982 · 60 citations

X-ray Spectroscopy, Engineering, Physics +10

Electron trajectory analysis of the spherical-sector electrostatic spectrometer: focussing properties and multichannel detection capability

J. Osterwalder, M. Sagurton, P. J. Orders et al. · Journal of Electron Spectroscopy and Related Phenomena · 1989 · 43 citations

Multichannel Detection Capability, Analytical Instrumentation, Physics +10

Surface-structure determinations by means of off-normal photoelectron diffraction: A kinematical analysis

Eric L. Bullock, C. S. Fadley, P. J. Orders · Physical review. B, Condensed matter · 1983 · 38 citations

Engineering, Nuclear Physics, Microscopy +24