ACS Applied Materials & Interfaces · 2010 · 44 citations · 12 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportLight-emitting DiodesLuminescent MaterialsNanowiresSemiconductor HeterostructuresSemiconductor PhysicsElectroluminescenceForward Bias CharacteristicsGallium Nitride Light-emitting DiodesLight-emitting DevicesNanowire HeterojunctionsNanowire Light-emitting DiodesRadiative RecombinationUltraviolet Light-emitting Diodes
Electroluminescence characteristics of a heterojunction light-emitting diode, which was fabricated by depositing a layer of randomly assembled n-SnO(2) nanowires on p-GaN:Mg/sapphire substrate via vapor transport method, were investigated at room temperature. Peak wavelength emission at around 388 nm was observed for the diode under forward bias. This is mainly related to the radiative recombination of weakly bounded excitons at the shallow-trapped states of SnO(2) nanowires, Under reverse bias, near bandedge emission from the p-GaN:Mg/sapphire leads to the observation of emission peak at around 370 nm.
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Electron affinity of AlxGa1−xN(0001) surfaces
S Grabowski, M. Schneider, Hermann Nienhaus et al. · Applied Physics Letters · 2001 · 208 citations
Natural Sciences, Materials Engineering, Materials Science +16
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Zhenguo Ji, Juan Du, Jia M. Fan et al. · Optical Materials · 2005 · 113 citations
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