Thermal cycling reliability of die bonding adhesives

Abstract

A study of thermal cycling endurance of three different die attach adhesives by measuring the increase in thermal resistance during a thermal cycling test is discussed. Test chips were bonded to three substrates with different coefficients of thermal expansion. The thermal resistance increased with increased number of temperature cycles. A large mismatch in thermal expansion gave the fastest increase in thermal resistance. The study also revealed a significant difference in behavior between the different adhesives.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>