2002 · 15 citations · 14 references
EngineeringSoftware SystemsSoftware EngineeringSystem-level DesignHardware SystemsSoftware AnalysisReliability EngineeringLanguage TestingTestabilityAsynchronous Vlsi DesignBehavioral SciencesBehavioral SpecificationDesignComputer EngineeringComputer ScienceDesign For TestingSoftware DesignBehavioral ModificationsTest-driven DevelopmentProgram AnalysisSoftware TestingFault CoverageTest Case DesignDesign For TestabilityTest Evolution
Behavioral specification of a VLSI design can be used to suggest behavioral modifications that improve testability of the design. Past work has been targeted at identifying the techniques that will enable such modifications. However, the impact of such behavioral modifications on the testability of a design has not been analyzed with regards to fault coverage and area overhead which is the focus of this paper. Results obtained show that the area overhead is low and the fault coverage is higher when the behavior is modified for testability. These results are compared with the results obtained when partial scan is used to improve the testability of a design.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
14
HITEC: a test generation package for sequential circuits
T.M. Niermann, J.H. Patel · 2002 · 522 citations
Behavioral synthesis for easy testability in data path allocation
T.C. Lee, W. Wolf, Niraj K. Jha et al. · 2003 · 50 citations
Engineering, Computer Architecture, Test Data Generation +25