Publication | Closed Access
Film Characterization of Ultra Low-k Dielectrics Modified by UV Curing with Different Wavelength Bands
11
Citations
2
References
2006
Year
Materials ScienceDielectricsEngineeringUv-vis SpectroscopyOptical PropertiesApplied PhysicsDifferent Wavelength BandsFilm CharacterizationElectrical PropertyOptoelectronicsThin Film ProcessingElectrical Insulation
| Year | Citations | |
|---|---|---|
Page 1
Page 1