Publication | Closed Access

Chemistry, microstructure, and electrical properties at interfaces between thin films of cobalt and alpha (6H) silicon carbide (0001)

Materials ScienceElectrical EngineeringEngineeringOxide ElectronicsSurface ScienceApplied PhysicsSilicon CarbideSemiconductor MaterialThin FilmsSilicon On InsulatorElectrical PropertiesCarbide